QRAM Ribbon Cartridge
Serialized, calibrated drop‑in head assembly containing the three‑ribbon / two‑membrane stack. Clean, vacuum‑ready, and alignment‑indexed for field replacement without touching the membranes.
Calibration:
Per‑unit optical phase & mechanical Q report included
Per‑unit optical phase & mechanical Q report included
Cleanliness:
UHV‑compatible; ALD‑capped dots; particle‑controlled packaging
UHV‑compatible; ALD‑capped dots; particle‑controlled packaging
Service time:
< 10 minutes swap via CIS‑T interposer
< 10 minutes swap via CIS‑T interposer
Key benefits
- True drop‑in — datum features & keyed connector ensure repeatable placement.
- Factory calibrated — serialized report (phase offset, optical overlap, mech Q).
- Vacuum‑clean — solvent‑free, ALD‑passivated surfaces, baked packaging.
- Membranes protected — isolation homes only; no electrical contacts.
- Fast turnaround — swap the head; keep the ASU on the bench.
- Multiple materials — Ti (balanced), NiTi (fatigue), ITO/Graphene (optics‑heavy).
- Traceability — QR code + serial match to calibration file.
- Warranty ready — seals show tamper/exposure history.
Core performance (cartridge acceptance)
| Metric | Acceptance | Notes |
|---|---|---|
| Optical overlap (idle) | 1–2 % | With kill‑switch spacer installed |
| Optical overlap (upkeep) | ≤ 5 % | Short bursts only |
| Optical loss in ribbon | ≤ 2.0 dB | Across window bandwidth |
| Mechanical Q (room temp) | ≥ 5,000 | Measured at mounts; membranes at strain node |
| Electrical leakage to membranes | < 1 pA | Field‑effect channel only; guard‑ringed |
| Flatness / planarity | ≤ 20 µm TIR | Across active span |
| Particulate (ISO class) | Class 6 or better | Per IEST‑STD‑CC1246D |
Architecture & materials
What’s inside
- Optic ribbon with cones & windows + photonic kill‑switch shim
- Two non‑conductive membranes (parabolic wells; dots both faces)
- Piezo ribbon (two‑tone BAE geometry)
- Semiconductor ribbon (field‑effect proxy with guard rings)
- CIS‑T interposer (grounded cone sheet) & gasket
Materials options
- Ti backbone — balanced, vacuum‑clean (standard)
- NiTi — superelastic, extended fatigue life
- ITO/Graphene hybrid — higher optical throughput
Membranes: SiN / h‑BN / SiC (50–200 nm). Dots: giant‑shell CdSe/CdS or InP/ZnSeS, ALD Al₂O₃ cap (2–5 nm).
Compatibility & installation
Compatible ASUs
- QRAM‑ASU‑G8 / G16 / G24 frames
- Harness: QNH‑25 interposer mating (keyed)
Install steps
- Power down ASU; vent if under vacuum.
- Open hatch; remove spent cartridge via latch.
- Inspect gasket; clean mating surface.
- Seat new cartridge (datum pins), close latch.
- Verify seals; run 60‑sec self‑check.
Handling & care
- ESD safe area; wrist strap recommended.
- Do not touch membranes; use the provided jig.
- Keep desiccant in the pouch until install.
- Operate only within ASU environmental limits.
Service life
- Typical cartridge life: 3–6 months or ~500 h vacuum time (whichever first)
- Storage: 12 months sealed, −10 to 35 °C, <60% RH
- Cleaning: do not solvent‑clean; return to factory
Ordering & SKUs
| SKU | Description | Notes |
|---|---|---|
| QRAM‑CAR‑Ti | Replacement ribbon cartridge — Ti | Serialized, calibrated head |
| QRAM‑CAR‑NiTi | Replacement ribbon cartridge — NiTi | High‑fatigue applications |
| QRAM‑CAR‑ITO | Replacement ribbon cartridge — ITO/Graphene | Optics‑heavy readout |
| QRAM‑CAR‑KIT | Field swap kit (jig + gasket + seals + desiccant) | One per bench recommended |
Included in the box
- Sealed cartridge in ESD pouch with desiccant
- Calibration & traceability card (QR code)
- Gasket & seal set
- Quick‑start swap guide